Browse Prior Art Database

Image Suspect List

IP.com Disclosure Number: IPCOM000108871D
Original Publication Date: 1992-Jun-01
Included in the Prior Art Database: 2005-Mar-23
Document File: 1 page(s) / 28K

Publishing Venue

IBM

Related People

Dinan, RF: AUTHOR [+5]

Abstract

For high volume item image capture, randomly defective images cannot be effectively found by sampling techniques. By employing a very conservative method of tagging images that may have defects, 100 percent of the images may be inspected by automatic means, and a suspect list can be generated. The images on the list may or may not be defective, but the probability of an image being defective in this subset is much higher than the general population, and the probability of a defective image being in the general population minus the suspected items is very low. In this way, 100 percent inspection of the suspect list is a very economical process.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 100% of the total text.

Image Suspect List

      For high volume item image capture, randomly defective images
cannot be effectively found by sampling techniques. By employing a
very conservative method of tagging images that may have defects, 100
percent of the images may be inspected by automatic means, and a
suspect list can be generated.  The images on the list may or may not
be defective, but the probability of an image being defective in this
subset is much higher than the general population, and the
probability of a defective image being in the general population
minus the suspected items is very low. In this way, 100 percent
inspection of the suspect list is a very economical process.  The
suspect list is a separate list generated at image capture time, and
is used to access the listed images from storage for inspection and
for exception handling when defects are verified.

      Disclosed anonymously.