Browse Prior Art Database

Time Domain Method of Measuring High Frequency Magnetic Resonance

IP.com Disclosure Number: IPCOM000109223D
Original Publication Date: 1992-Aug-01
Included in the Prior Art Database: 2005-Mar-23
Document File: 2 page(s) / 78K

Publishing Venue

IBM

Related People

Brady, MJ: AUTHOR [+2]

Abstract

Disclosed is an optical stroboscopic sampling technique for pulse magnetic resonance measurements that utilizes an optical detection scheme allowing efficient coupling to very small samples (limited only by focussing). The technique is implemented with picosecond and subpicosecond dye lasers, polarizing optics and coplanar transmission lines on semi-insulating semiconductor substrates. Using standard semiconductor processing, a photolithographic resist stencil is defined on a semi-insulating semiconductor substrate, such as GaAs, Si, InP, InAs, etc. Metals, such as gold, aluminum, or copper, are vacuum deposited, and lift off is performed, leaving behind a coplanar transmission line.

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Time Domain Method of Measuring High Frequency Magnetic Resonance

       Disclosed is an optical stroboscopic sampling technique
for pulse magnetic resonance measurements that utilizes an optical
detection scheme allowing efficient coupling to very small samples
(limited only by focussing).  The technique is implemented with
picosecond and subpicosecond dye lasers, polarizing optics and
coplanar transmission lines on semi-insulating semiconductor
substrates.  Using standard semiconductor processing, a
photolithographic resist stencil is defined on a semi-insulating
semiconductor substrate, such as GaAs, Si, InP, InAs, etc.  Metals,
such as gold, aluminum, or copper, are vacuum deposited, and lift off
is performed, leaving behind a coplanar transmission line.  Sample
areas of a sample to be probed are placed within the gap of the
transmission line shown in the figure, which has a voltage bias
applied, and provides the basis for a photoconductive switch.  An
optical pump pulse directed onto the substrate generates a current
transient along the transmission line.  This is accompanied by a
perpendicular magnetic pulse which couples to the spin system of the
sample under investigation.  The sample is subject to an in-plane
external static magnetic field.  The torque on the magnetization due
to the current pulse causes the spins to rotate in the plane away
from the static field.  The subsequent free precession of the
magnetization about the static applied field may...