Browse Prior Art Database

Automatic Electronic Card Transport and Temperature Conditioning System

IP.com Disclosure Number: IPCOM000109224D
Original Publication Date: 1992-Aug-01
Included in the Prior Art Database: 2005-Mar-23
Document File: 2 page(s) / 88K

Publishing Venue

IBM

Related People

Bonnet, TJ: AUTHOR [+2]

Abstract

Disclosed is a system that provides a method of testing electronic card assemblies (ECA) at a controlled temperature in a high volume, continuous flow manufacturing (CFM) environment. This system consists of three major sub-systems. The first sub-system is the automatic card transport system. The second sub-system is the temperature application (conditioning) system. The third sub-system is the dynamic (at product design data or processor speeds) functional test system.

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Automatic Electronic Card Transport and Temperature Conditioning System

       Disclosed is a system that provides a method of testing
electronic card assemblies (ECA) at a controlled temperature in a
high volume, continuous flow manufacturing (CFM) environment.  This
system consists of three major sub-systems.  The first sub-system is
the automatic card transport system.  The second sub-system is the
temperature application (conditioning) system.  The third sub-system
is the dynamic (at product design data or processor speeds)
functional test system.

      The automatic card transport sub-system consists of four
sections. These four sections are:  1)  the input conveyor section.
This section also contains a product bar code read station,  2)  a
first in first out (FIFO) buffer indexing section. This section
resides inside a controlled temperature chamber,  3)  a test fixture
load and unload section, and 4) the unload conveyor section.  This
sub-system has programmable width and variable length capability.
This capability will transport ECAs from 3.0 to 12.0 inches wide and
from 4.0 to 18.0 inches long.  Finally, the top and bottom transport
clearances for the ECAs are 1.9 and 0.9 inches, respectively.

      The closed-loop temperature conditioning sub-system consists of
two sections: 1) the 40 ECA position temperature pre-conditioning
section, and 2) the single ECA position controlled temperature test
station.  The pre-conditioning section will...