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Active Board Channel Maintenance Noise Simulation and Test Method

IP.com Disclosure Number: IPCOM000109637D
Original Publication Date: 1992-Sep-01
Included in the Prior Art Database: 2005-Mar-24
Document File: 2 page(s) / 115K

Publishing Venue

IBM

Related People

Bellamy, PD: AUTHOR [+3]

Abstract

Active Board Channel Maintenance (ABCM) is a feature in which channel cards can be replaced in a system without any impact to machine operation, i.e., without powering down the channel board. This feature dramatically increases machine availability on large systems.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 52% of the total text.

Active Board Channel Maintenance Noise Simulation and Test Method

       Active Board Channel Maintenance (ABCM) is a feature in
which channel cards can be replaced in a system without any impact to
machine operation, i.e., without powering down the channel board.
This feature dramatically increases machine availability on large
systems.

      The making and breaking of the live electrical connections
associated with the ABCM procedure is called "hot plugging".  The
concern with the "hot-plug" activity is that noise spikes induced
during the defective card replacement could adversely affect adjacent
online channel card operation.

      This article describes a procedure that can reproduce
electronically, the voltage fluctuations that are presented to the
online, adjacent channel card power pins, thereby creating an
environmental situation that is equivalent to the noise induced when
an actual card is hot-plugged.

      Using standard equipment, the noise voltage from an actual
hot-plug is captured and characterized.  This noise voltage is then
reproduced onto the power structure of the board in order to simulate
the noise generated from card plugging.  The following figure depicts
the key elements of this disclosure.  The embodiment can be thought
of as a tester which is applied to a device or system, but the tester
is not part of the device itself.  The major items are as follows:
1.   DUT - Device under test.  This is the system or sub-assembly
which is being evaluated.  It can be a stand-alone item or a part of
a larger system.  In some manner this device is affected by some
event, depicted as the "Actual Noise Event".  This noise event could
be caused internally or externally from the DUT.
2.   Capture D...