Browse Prior Art Database

IR Analysis Method of Contamination on the Air Bearing Surface

IP.com Disclosure Number: IPCOM000110540D
Original Publication Date: 1992-Dec-01
Included in the Prior Art Database: 2005-Mar-25
Document File: 2 page(s) / 48K

Publishing Venue

IBM

Related People

Nakajima, M: AUTHOR [+2]

Abstract

This article describes the IR analysis method of contamination on the Air-Bearing Surface of a small magnetic head for LED. This is the measurement method in order to get the IR spectrum of very thin and small contamination absorbed on the flat surface where the surface has smaller refractive index than that of the contamination.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 91% of the total text.

IR Analysis Method of Contamination on the Air Bearing Surface

       This article describes the IR analysis method of
contamination on the Air-Bearing Surface of a small magnetic head for
LED.  This is the measurement method in order to get the IR spectrum
of very thin and small contamination absorbed on the flat surface
where the surface has smaller refractive index than that of the
contamination.

      This analysis method is done as the following procedure.  At
first, a flat Si or Al plate, whose surface is optically polished, is
washed ultrasonically with acetone, or ethanol, or other organic
solvent, in order to get the clean surface.  Next, in order to
transfer the contamination to the Si/Al plate surface, the
contaminated Air-Bearing Surface is rubbed on the Si/Al plate
surface.  After the confirmation of transference under the
microscope, the contamination on the Si/Al plate is measured by
micro-FTIR.

      If the contamination is not transferred on the Si/Al plate, a
small amount of acetone or other organic solvent is dropped on the
Si/Al plate surface, and the Air-Bearing Surface is rubbed on the
Si/Al plate surface again.  In the case of using the equipment in the
figure, it is very easy to transfer the contamination.

      In the case of using Si plate, this contamination is measured
by transmittance mode of micro-FTIR, and the case of using Al plate
is reflection mode of micro-FTIR.

      By using this method, IR spectrum of the c...