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Browse Prior Art Database

Probe Holder for Electrical Characterization

IP.com Disclosure Number: IPCOM000111089D
Original Publication Date: 1994-Feb-01
Included in the Prior Art Database: 2005-Mar-26
Document File: 2 page(s) / 50K

Publishing Venue

IBM

Related People

Boulet, JY: AUTHOR [+6]

Abstract

Disclosed is a tool for holding multi-probes during electrical characterization of a surface mount module on a card. The attached Figure describes the new solution tool.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 89% of the total text.

Probe Holder for Electrical Characterization

      Disclosed is a tool for holding multi-probes during electrical
characterization of a surface mount module on a card.  The attached
Figure describes the new solution tool.

      The problem to solve is to probe accessible signals at card
level.  A usual way is to directly probe the vias close to the module
area.  Major problems encountered are:

o   Mono point measurement (one probe only) with manual holding.

o   Bad accuracy due to mismatch between the via diameter and the
    probe diameter.

o   Bad reproducibility

o   Not easy to use (bad readability)

o   Floating GND reference (antenna effects)

      The new tool is built with two thick copper planes separated
with a conductive elastomer.  This probe holder is drilled and each
hole is able to hold an advanced coaxial probe.  Large conductive
pads coaxial to the previous holes are designed on the card and wired
to signal IO's into module area.  So the tip of the probe (signal
part) is in contact with the signal IO to be measured.  The tool is
securely screwed with stand off and connected to the internal GND
plane of the card.  The elastomer part is pressed between the two
copper planes and so a "meniscus" appears inside each hole (see
enlarged view).  This improves the electrical contact between the
external edge of the probe (GND part) and the copper plane tied to
the card.

As a result the advantages are:

o   Multi points measurement....