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Automatic Test Generator and Fault Grader

IP.com Disclosure Number: IPCOM000113357D
Original Publication Date: 1994-Aug-01
Included in the Prior Art Database: 2005-Mar-27
Document File: 2 page(s) / 43K

Publishing Venue

IBM

Related People

Blevins, BJ: AUTHOR [+2]

Abstract

An invention to perform automatic fault grading and test generation at card level, which can be adapted to functional test. Dynamic Programmable Logic devices and Programmable Interrconnect devices are used to implement a stimulus generator and stimulus collector which recursively inserts faults and verifys fault detection. After training phase, stimulus generator is removed and collector is used as a functional tester.

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Automatic Test Generator and Fault Grader

      An invention to perform automatic fault grading and test
generation at card level, which can be adapted to functional test.
Dynamic Programmable Logic devices and Programmable Interrconnect
devices are used to implement a stimulus generator and stimulus
collector  which recursively inserts faults and verifys fault
detection.  After training phase, stimulus generator is removed and
collector is used as a functional tester.

      During training phase, controller maps logic representing scan
path or funtional logic, into network of Programmable Interconnect
(PI) and Dynamic Programmable Logic (DPL) cells.  Controller then
generates a first approximation of scan string or test vector.
Controller then analyzes signature generated from test outputs of
network and stores result.  A fault is inserted from list of possible
faults, compiled prior to training.  Stimulus is then re-run, and
signature re-taken.  If signature patterns match, controller modifies
pattern (could not detect fault), else if they do not match and
correct fault code is not generated, back-propagation is used on
collector to train for new pattern.

      Training continues until all possible faults are covered, or
until percentage of desired fault coverage is obtained.  Once desired
level of coverage is obtained stimulus section is removed, and
collector is used to test the system modeled during training phase.

      Stimulus generator can...