Browse Prior Art Database

Combined Optical Inspection and Electrical Measurement System

IP.com Disclosure Number: IPCOM000113821D
Original Publication Date: 1994-Oct-01
Included in the Prior Art Database: 2005-Mar-27
Document File: 2 page(s) / 32K

Publishing Venue

IBM

Related People

Mahlbacher, J: AUTHOR [+3]

Abstract

Disclosed herein is the design of a system capable of performing both the visual inspection and electrical measurement of components with circuits required for quality control during manufacture. In prior art, electrical measurement and visual inspection were performed independently by different systems. This design incorporates visual inspection capability and an electric measurement capability into the same system under a common controller.

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Combined Optical Inspection and Electrical Measurement System

      Disclosed herein is the design of a system capable of
performing both the visual inspection and electrical measurement of
components with circuits required for quality control during
manufacture.  In prior art, electrical measurement and visual
inspection were performed independently by different systems.  This
design incorporates visual inspection capability and an electric
measurement capability into the same system under a common
controller.

      Electrical testing requires programming control of test probes
to obtain electrical measurements of component circuits and to
isolate defects based on those measurements.  This function is
performed by a probe tester incorporating a number of proprietary
features.  Visual inspection requires programming control of the
positioning of cameras used to acquire images of the Device Under
Test (DUT) and interrogation of those images using image processing
and analysis techniques to identify defects.  This function is
performed by a machine vision system.

      By incorporating both capabilities into a single system, the
combined optical inspection and electrical measurement system
achieves significant improvements in cost and performance.