Browse Prior Art Database

Storing Failure Information into Non-Volatile Memory

IP.com Disclosure Number: IPCOM000114175D
Original Publication Date: 1994-Nov-01
Included in the Prior Art Database: 2005-Mar-27
Document File: 2 page(s) / 42K

Publishing Venue

IBM

Related People

Davidson, J: AUTHOR [+3]

Abstract

Disclosed is a method to reduce the incidence of "No Defect Found" during retest at a repair facility by storing field failure information in a suspected failing Field Replaceable Unit. This allows all relevant failure information to be sent back to the repair facility with the Field Replaceable Unit so that the failures can be more easily replicated and diagnosed.

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Storing Failure Information into Non-Volatile Memory

      Disclosed is a method to reduce the incidence of "No Defect
Found" during retest at a repair facility by storing field failure
information in a suspected failing Field Replaceable Unit.  This
allows all relevant failure information to be sent back to the repair
facility with the Field Replaceable Unit so that the failures can be
more easily replicated and diagnosed.

      Current systems use Read Only Memory (ROM) on each Field
Replaceable Unit to store Vital Product Data, and one system wide
non-volatile memory to store failure information (Fig. 1).

      This proposal replaces the Read Only Memories with electrically
alterable non-volatile memories (Fig. 2).  In addition to storing
error information into the system non-volatile memory, this proposal
will also store the failure information into the electrically
alterable non-volatile memory on the failing Field Replaceable Unit
along with additional system configuration information to help
replicate and diagnose the failure.  Because the Vital Product Data
needs to be protected, this memory is only accessible by the service
processor, and only the failure information fields are alterable in
normal operation.