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Psychometric Inspection System of Point Defect on Thin Film Transistor/Liquid Crystal Display

IP.com Disclosure Number: IPCOM000114884D
Original Publication Date: 1995-Feb-01
Included in the Prior Art Database: 2005-Mar-30
Document File: 2 page(s) / 57K

Publishing Venue

IBM

Related People

Tamura, T: AUTHOR [+3]

Abstract

Disclosed is an Inspection System of point defect on Thin Film Transistor/Liquid Crystal Displays (TFT/LCDs). The active matrix TFT/LCDs have a small number of defecting sub-pixels, point defect, that do not work. The objective of this inspection system is to rank TFT/LCDs which contain a few defecting sub-pixels according to the score automatically. The score is derived from the luminance, the colors, the location and the number of defecting sub-pixels and is developed based on sensory evaluation.

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Psychometric Inspection System of Point Defect on Thin Film Transistor/Liquid
Crystal Display

      Disclosed is an Inspection System of point defect on Thin Film
Transistor/Liquid Crystal Displays (TFT/LCDs).  The active matrix
TFT/LCDs have a small number of defecting sub-pixels, point defect,
that do not work.  The objective of this inspection system is to rank
TFT/LCDs which contain a few defecting sub-pixels according to the
score automatically.  The score is derived from the luminance, the
colors, the location and the number of defecting sub-pixels and is
developed based on sensory evaluation.

      This system consists of the five units.  The Figure shows the
example of this system.  The first unit contains image sensor and
memory to measure the luminance, the color and the location of each
defecting sub-pixel on a TFT/LCD.  The second unit has a coefficient
table and computes Luminance Score of each defecting sub-pixel by the
following equation.
        Luminance Score = AlogL+B

Where A and B are the coefficients which are determined by the color
of each defecting sub-pixel.  L is the luminance measured by the
first
unit.  The third unit holds another coefficient table and computes
Location Score of each defecting sub-pixel by the following equation.
        Location Score = C*10E(-D*d)

Where C and D are the coefficients which are determined by where the
defecting sub-pixel exists.  A TFT/LCD is divided into four areas by
a horizontal...