Browse Prior Art Database

PowerPC 603 and 403 Standard Breakout and Test Probe Card

IP.com Disclosure Number: IPCOM000115582D
Original Publication Date: 1995-May-01
Included in the Prior Art Database: 2005-Mar-30
Document File: 6 page(s) / 202K

Publishing Venue

IBM

Related People

Jensen, HJ: AUTHOR [+4]

Abstract

A portable probe test card is defined that allows the user to monitor the signals of a PowerPC* 603 or PowerPC 403 microprocessors insitu on a circuit card. Also defined is the surface mount fanout to large hole vias for the microprocessors. The test card provides a highly reliable electrical connection to the circuit card without wasting card space by requiring extra test points.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 52% of the total text.

PowerPC 603 and 403 Standard Breakout and Test Probe Card

      A portable probe test card is defined that allows the user to
monitor the signals of a PowerPC* 603 or PowerPC 403 microprocessors
insitu on a circuit card.  Also defined is the surface mount fanout
to large hole vias for the microprocessors.  The test card provides a
highly reliable electrical connection to the circuit card without
wasting card space by requiring extra test points.

      Two probe test cards were designed, one for the PowerPC 403 and
one for the PowerPC 603.  The probe test card has a standard set of
connectors on one side for connecting to a Tektronix DAS** 9200 with
92A96 probes, or to other logic analyzers.  On the other end of the
probe test card are pins that plug into a socket soldered to the
production card's 403 or 603 fanout vias.

      To use this probe test card you would first solder connectors
into the fanout vias on your production or development circuit card,
plug a probe test card into it, then plug a logic analyzer into the
probe test card.  This generates a good electrical connection between
the logic analyzer and the 403 or 603.  It also allows the logic
analyzer and the probe test card to easily be moved between
production cards.

      Note that the use of a standard fanout and a probe test card
means that very little extra real estate was used up on the
development card.  This allows the development card to be your ship
level product.  And it allows you to take field returned cards and
easily connect up a logic analyzer.

      Fig. 1 shows the PowerPC 403 electrical fanout used on the
production cir...