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Chemically Modified Atomic Force Microscopy Tips for Measurements of Adhesive Forces at Surfaces: Nanoadhesion Measurements

IP.com Disclosure Number: IPCOM000116916D
Original Publication Date: 1995-Nov-01
Included in the Prior Art Database: 2005-Mar-31
Document File: 4 page(s) / 79K

Publishing Venue

IBM

Related People

Porter, MD: AUTHOR [+2]

Abstract

Adhesive forces play a critical role in technologically important interfaces (e.g., polymer-polymer, polymer-metal). This method provides a means to measure such forces at a nanostructural level using compositionally well-defined interfaces. Results from such nanoadhesion measurements will provide important insights for optimizing these interfaces.

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Chemically Modified Atomic Force Microscopy Tips for Measurements
of Adhesive Forces at Surfaces: Nanoadhesion Measurements

      Adhesive forces play a critical role in technologically
important interfaces (e.g., polymer-polymer, polymer-metal).  This
method provides a means to measure such forces at a nanostructural
level using compositionally well-defined interfaces.  Results from
such nanoadhesion measurements will provide important insights for
optimizing these interfaces.

      Described is an approach for measuring adhesive forces at
functionalized oraganic surfaces.  It combines a physical method of
measurement by Atomic Force Microscopy (AFM) with chemical tailoring
of the AFM tip by molecular self-assembly.

      Methods presently used to measure adhesive forces are
macroscopic, i.e., they average over a large sample surface area.
With an AFM, adhesive forces at sub-microscopic to atomic-scale
dimensions may be determined.  The strategy described here is to
alter the chemical composition of the AFM tip in order to manipulate,
in a systematic manner, the nature of the chemical interactions
between the tip and a sample surface.  Through chemical modification,
a well-defined tip surface of a specific composition is created.
This will be accomplished by two synthetic routes, both of which rely
on chemical reactions between the hydrated oxide layer of the AFM tip
and the chemical modifier.  Two possible derivatization chemistries
are:  silane chemi...