Browse Prior Art Database

Open-Frame Product Cradle for Probing

IP.com Disclosure Number: IPCOM000117117D
Original Publication Date: 1995-Dec-01
Included in the Prior Art Database: 2005-Mar-31
Document File: 2 page(s) / 61K

Publishing Venue

IBM

Related People

Boyette, J: AUTHOR [+2]

Abstract

Disclosed is a cradle for holding a number of electronic devices, such as multi-chip modules or printed circuit boards, during a high speed probing process to determine the electrical characteristics of the devices. Calculations based on the thicknesses of devices to be tested and the available motion of probes used for the test process indicate that, in the regions adjacent to the devices under test, the overall thickness of the cradle must be less than 1.6 millimeters to avoid contact between the probes and the cradle.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 75% of the total text.

Open-Frame Product Cradle for Probing

      Disclosed is a cradle for holding a number of electronic
devices, such as multi-chip modules or printed circuit boards, during
a high speed probing process to determine the electrical
characteristics of the devices.  Calculations based on the
thicknesses of devices to be tested and the available motion of
probes used for the test process indicate that, in the regions
adjacent to the devices under test, the overall thickness of the
cradle must be less than 1.6 millimeters to avoid contact between the
probes and the cradle.

      The Figure is a plan view of a version of the cradle 10 having
four apertures 12 into which the devices to be tested (not shown) are
loaded for the probing process.  Principle parts of the cradle 10 are
spring steel plates 14, in which the apertures 12 are formed, and an
aluminum frame 16 extending around the plates 14, fastened thereto by
a number of screws 18.  Within an aperture 12, a device to be tested
rests on ledges formed by thin spring steel tabs 20, which are
adhesively attached to the underside of plates 14.  Each aperture 12
includes a rounded notch 22, providing finger clearance to facilitate
the manual loading and unloading of devices for testing.

      A clamping disk 24, movable within an arcuate slot 26, is used
to clamp a device for testing within each adjacent aperture 12.  Each
slot 26 is open at one end to this aperture 12, with a remaining side
28 of the slot 26 bein...