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Method to Speed Overall Test Time for a Serial Based Galloping Pattern Algorithm

IP.com Disclosure Number: IPCOM000117138D
Original Publication Date: 1995-Dec-01
Included in the Prior Art Database: 2005-Mar-31
Document File: 2 page(s) / 30K

Publishing Venue

IBM

Related People

Aipperspach, TG: AUTHOR [+6]

Abstract

A method to speed overall test time for a serial based Galloping Pattern (Galpat) algorithm is described.

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Method to Speed Overall Test Time for a Serial Based Galloping Pattern
Algorithm

      A method to speed overall test time for a serial based
Galloping Pattern (Galpat) algorithm is described.

      The serial Galpat algorithm is an n squared algorithm with n
being the array depth.  Because of this, larger arrays may take too
much time to test with this algorithm.

      To solve this problem, the array should be physically divided
up into smaller subsections.  These smaller sections have to be made
physically independent of each other.  The serial Galpat algorithm
can then be repeated on the small sections until the entire array has
been fully tested.  For example: a 512x73 array could be divided
physically into 4 128x73 arrays.  The Galpat test would be done on
each section individually.  This means the test would be repeated
four times.  But because the algorithm is n squared, the overall test
time is 1/4 what it would have been if the complete array was done
together.  A key point is that the subarrays must be physically
separated to ensure the viability of the serial Galpat algorithm.