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Robust Connector for Test Processes

IP.com Disclosure Number: IPCOM000117139D
Original Publication Date: 1995-Dec-01
Included in the Prior Art Database: 2005-Mar-31
Document File: 2 page(s) / 43K

Publishing Venue

IBM

Related People

Behm, G: AUTHOR [+4]

Abstract

Disclosed is a connector configured for the very high usage rates associated with circuit test equipment which must be connected to electronic devices coming off a production line.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 90% of the total text.

Robust Connector for Test Processes

      Disclosed is a connector configured for the very high usage
rates associated with circuit test equipment which must be connected
to electronic devices coming off a production line.

      The Figure is an isometric view of the test equipment connector
10 in an explode d relationship with a plug 12 extending from a
device to be tested.  The test equipment connector 10 includes a
block separated into two half-portions 14, which are held together by
a compression spring 16 operating against a surface of an insulating
box structure (not shown) in which the connector 10 is mounted.  Each
half portion 14 is further divided into two sections 18, which are
separated by insulating spacers 20, and which are held together by
insulating pins 22.  At each end, the two half portions 14 are
electrically connected by a flexible jumper 24, and the two sections
18 are individually wired in a cable 26 extending to the test
equipment (not shown).

      The insulating spacers 20 and pins 22 may be composed of a
thermoplastic material, such as acetal.  The remaining portions of
the blocks 14 are preferably composed of a hard material for long
life, such as AMPCO 18 Bronze.

      In usage, the plug 12 is inserted so that its pins 28 are
forced between the two half-portions 14, which are then held in
contact with the pins 28 by spring 16, and so that one of the pins 28
lies on each side of the insulating spacers 20.  After the test
p...