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Browse Prior Art Database

Narrow Conveyor Functional Text Fixture

IP.com Disclosure Number: IPCOM000117225D
Original Publication Date: 1996-Jan-01
Included in the Prior Art Database: 2005-Mar-31
Document File: 2 page(s) / 55K

Publishing Venue

IBM

Related People

Stirbisky, RM: AUTHOR [+2]

Abstract

This disclosure details a method of getting a relatively large circuit close to an electrical product under test, where the available access space is limited to a very narrow width, in this case 1.4 inches. An interface card with test probes and card edge connectors allows probing the cards and routing of the signals to large cards placed on edge, thus allowing the required close access.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 64% of the total text.

Narrow Conveyor Functional Text Fixture

      This disclosure details a method of getting a relatively
large circuit close to an electrical product under test, where the
available access space is limited to a very narrow width, in this
case 1.4 inches.  An interface card with test probes and card edge
connectors allows probing the cards and routing of the signals to
large cards placed on edge, thus allowing the required close access.

      This disclosure details how two relatively large circuit boards
were put into an extremely narrow open space.  The heart of the
invention is demonstrated in the interface circuit board used to
implement it.  This circuit board is shown in the Figure.

      The circuit board is mounted in a plane parallel to the one of
the unit under test.  Spring loaded test probes were used to make
electrical contact with the unit under test.  These probes solder to
the 'random' holes at one end of the test cards.

      All the signals were then routed in this interface card to two
connectors mounted sideways.  These two card edge connectors mate to
two test boards.  All the test circuitry is installed on one of these
two boards, and because they are turned sideways, each board can be
very large but still fit in the 1.4" allocated width.  In addition,
each board can be debugged in an open environment, not cramped for
room.  The known working boards can then be placed in the final test
assembly.

      The interface card wa...