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Low Signal Path Length for Spring Loaded Test Probes

IP.com Disclosure Number: IPCOM000117244D
Original Publication Date: 1996-Jan-01
Included in the Prior Art Database: 2005-Mar-31
Document File: 2 page(s) / 44K

Publishing Venue

IBM

Related People

Vig, HN: AUTHOR

Abstract

Spring loaded test probes are wired to test equipment using significant lengths of wire. This wire length introduces problems with circuit operation due to parasitic effects. A method is disclosed for reducing the wire lengths to an absolute minimum.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 88% of the total text.

Low Signal Path Length for Spring Loaded Test Probes

      Spring loaded test probes are wired to test equipment using
significant lengths of wire.  This wire length introduces problems
with circuit operation due to parasitic effects.  A method is
disclosed for reducing the wire lengths to an absolute minimum.

      The Figure shows a standard spring loaded probe 1 and a socket
2 used to electrically test circuit boards and their components.  The
sockets 2 are mounted in a durable and dimensionally stable substrate
5, such as G10-fiberglass, in a pattern to match the locations of the
electrical contacts on the circuit boards under test.  Each socket 2
is then fitted with a spring loaded probe 1 to make contact with the
circuit boards.  The other end of the socket is wired to the test
equipment.

      Probes 1 are currently made in styles to allow efficient wiring
by crimping, soldering, or wire wrapping a wire to the back of the
probe 1.

      An extremely short signal path to reduce circuit inductance and
crosstalk to bare minimums was required.  A circuit board was made up
with the test circuit on it.  The connection from the circuit board
to a standard test probe 1 was made by designing the circuit board
with a series of holes 6 which can accept a component lead of the
dimensions of the square wire wrap post 3 on the standard probe 1.
The circuit board was then soldered to the back of all the installed
test probes, as if the posts were component...