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Browse Prior Art Database

Improved Hardfile Manufacturing Self-Test

IP.com Disclosure Number: IPCOM000117466D
Original Publication Date: 1996-Mar-01
Included in the Prior Art Database: 2005-Mar-31
Document File: 2 page(s) / 56K

Publishing Venue

IBM

Related People

Swanson, B: AUTHOR

Abstract

Disclosed is a method which identifies the benefits of a command driven manufacturing test and those of a self-test are combined to allow a flexible self-test: one in which the test algorithm can be changed without altering the self-test code.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 63% of the total text.

Improved Hardfile Manufacturing Self-Test

      Disclosed is a method which identifies the benefits of a
command driven manufacturing test and those of a self-test are
combined to allow a flexible self-test:  one in which the test
algorithm can be changed without altering the self-test code.

      IBM Corporation has been creating disk-resident code to
exercise Direct Access Storage Devices (DASDs) or hardfiles at least
since 1987.  At first, they were used primarily to burn-in the file
with Customer Simulated Operation (CSO) which would exercise the
hardware in an effort to expose early-life failures of the
components.  Since then we have added Surface Analysis Tests (SAT)
to identify defective portions of the disk to be "mapped-out" and
avoided by the Product code, as well as many other tasks to customize
the operation of the hardfile given its components measurable
characteristics.  Each of these operations, called commands, were
internalized in the code, with the self-test code "hard-wired" to
perform the specific operations from an internal list.  This
improvement is basically, the externalization of that operation or
command list.

      The external list is a set of Small Computer System Interface
(SCSI) command blocks followed immediately by the SCSI data-out phase
data if required by the command.  A special End Of File command is
written to mark the end of the list.

      Since the file may be subject to voltage extremes during the
testing a...