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Error Detection/Fault Isolation in VHDL

IP.com Disclosure Number: IPCOM000117471D
Original Publication Date: 1996-Mar-01
Included in the Prior Art Database: 2005-Mar-31
Document File: 2 page(s) / 43K

Publishing Venue

IBM

Related People

Dubois, M: AUTHOR

Abstract

"Error Detection/Fault Isolation (ED/FI) in VHDL" provides an automated process for evaluating logic card and component failure probabilities for error syndromes in VHDL logic designs. This automated process has the potential of greatly reducing the labor effort required in today's ED/FI design methodologies, while substantially improving the quality level of ED/FI evaluations.

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Error Detection/Fault Isolation in VHDL

      "Error Detection/Fault Isolation (ED/FI) in VHDL" provides an
automated process for evaluating logic card and component failure
probabilities for error syndromes in VHDL logic designs.  This
automated process has the potential of greatly reducing the labor
effort required in today's ED/FI design methodologies, while
substantially improving the quality level of ED/FI evaluations.

      "ED/FI in VHDL" places the responsibility of identifying the
relationships that exist between error symptoms and probable failed
hardware squarely with the designer, the person closest to the
design.  Symptom notations, which appear as comments to the VHDL
compiler, are imbedded directly in the VHDL source code.  These
notations then become the basis for identifying expected test
results.

      The software that executes against the VHDL source code
identifies probable hardware by error symptom and calculates
probability distributions, thus allowing RAS to better evaluate what
FRUs need to be replaced to lead to higher levels of "first time
fixes" in the field.  This data then becomes the basis for improved
test productivity and test quality.

      RAS tests are primarily concerned with validating if/what
Error Detection circuits (error symptoms) are activated when faults
are inserted, via simulation and/or hardware, and "when error
detection does occur", observing if/what FRU(s) the Maintenance
Package identifies as the prob...