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Magnetic Thin Film Structures for Eddy Current Reduction and Domain Closure

IP.com Disclosure Number: IPCOM000118598D
Original Publication Date: 1997-Apr-01
Included in the Prior Art Database: 2005-Apr-01
Document File: 2 page(s) / 46K

Publishing Venue

IBM

Related People

Arnoldussen, TC: AUTHOR [+6]

Abstract

Disclosed is a method whereby eddy current loss and undesirable edge closure domains in the write head are the primary mechanisms that affect the intrinsic head field rise time. Past inventions only provide structures which yield improved domain configuration without the improvement in eddy current reduction (*).

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This is the abbreviated version, containing approximately 100% of the total text.

Magnetic Thin Film Structures for Eddy Current Reduction and Domain
Closure

      Disclosed is a method whereby eddy current loss and undesirable
edge closure domains in the write head are the primary mechanisms
that affect the intrinsic head field rise time.  Past inventions only
provide structures which yield improved domain configuration without
the improvement in eddy current reduction (*).

      The magnetic thin film structures presented in this disclosure
can significantly reduce both eddy current loss, as well as improve
the domain configuration of the write head.  Fig. 1 shows a section
of the head structure.  The thin film structure consists of two or
more magnetic layers separated by an insulator.  In Fig. 1, a basic
two layer structure is shown.  This structure is different from a
conventional laminate because the edge of the top and bottom layers
are connected at one of the edges.  This couples the two layers
magnetically so that the edge closure domain does not form at the
edge of the structure.  By inserting the non-conductive spacer, the
effective conduction area has been increased by a factor of two.
Therefore, the  eddy current loss can be reduced by 50%.  Figs. 2 and
3 show several other possible thin film structures.
  Reference
  (*) U.S. Patent 5,388,019