Browse Prior Art Database

Method for Measuring Flexible Magnetic Media System Response to Acquired Defects

IP.com Disclosure Number: IPCOM000119795D
Original Publication Date: 1991-Feb-01
Included in the Prior Art Database: 2005-Apr-02
Document File: 1 page(s) / 58K

Publishing Venue

IBM

Related People

Barth, HV: AUTHOR

Abstract

A method is described for measuring the response of a flexible magnetic media system (read-write device) to acquired defects. An acquired defect is defined as dust, or other foreign matter, on the surface of the media that was not present when the media was written.

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This is the abbreviated version, containing approximately 62% of the total text.

Method for Measuring Flexible Magnetic Media System Response to Acquired
Defects

      A method is described for measuring the response of a flexible
magnetic media system (read-write device) to acquired defects.  An
acquired defect is defined as dust, or other foreign matter, on the
surface of the media that was not present when the media was written.

      Computers receive their instructions from software which is
usually flexible magnetic media in disk, or reel, form.  The program
is written on the media by a read-write device.  A typical failure
mode of the media is when dust or other debris falls on the media
surface and causes a loss of signal strength due to the separation
from the head of the read-write device.  Some read-write devices can
read media with all but the most severe acquired defects.  Other
read-write devices may have difficulty with even the smallest media
defect.  The method described herein uses media with known level
defects to measure the ability of read-write devices to read media
with acquired defects. These devices can be compared and certified
for use as software program read devices.  Other methods of testing
the channel, such as noise generators, test the circuitry of the
read-write device, but not the head-media interface and its
interaction with the actual defects that usually cause failures.
Media with known level defects tests the entire system including
media, head-media interface and circuitry.

      Actual media u...