Browse Prior Art Database

Multilayer Ceramic Space Transformer Contactor

IP.com Disclosure Number: IPCOM000120500D
Original Publication Date: 1991-May-01
Included in the Prior Art Database: 2005-Apr-02
Document File: 1 page(s) / 21K

Publishing Venue

IBM

Related People

Gerth, F: AUTHOR [+5]

Abstract

During automatic wafer testing, a space transformer is positioned between the performance board and the actual probe. This space transformer serves to fan out the dense footprint to the next wiring plane, with a large number of densely packaged single wires extending parallel to each other.

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Multilayer Ceramic Space Transformer Contactor

      During automatic wafer testing, a space transformer is
positioned between the performance board and the actual probe.  This
space transformer serves to fan out the dense footprint to the next
wiring plane, with a large number of densely packaged single wires
extending parallel to each other.

      It is proposed to replace the previously used space transformer
by standard multilayer ceramic substrates. These reduce the
capacitive coupling and improve the power distribution.  In addition,
during wafer testing, the environmental conditions of the test system
are largely adapted to those of customer mainframe packaging.