Dismiss
InnovationQ will be updated on Sunday, Oct. 22, from 10am ET - noon. You may experience brief service interruptions during that time.
Browse Prior Art Database

Power Switching With Arbitration for a Functional Tester

IP.com Disclosure Number: IPCOM000120582D
Original Publication Date: 1991-May-01
Included in the Prior Art Database: 2005-Apr-02
Document File: 1 page(s) / 54K

Publishing Venue

IBM

Related People

Knox, AR: AUTHOR [+2]

Abstract

A circuit interlock scheme which prevents operators of a functional tester from lethal voltages accidentally caused by control software or other errors. The test system power supplies are also protected from serious damage which could result from an illegal test condition or sequence. Standard practice is to only handle runs of a single card type and only one card can be fully fixtured. This tester is capable of simultaneously fixturing two different types of analog cards, each with different power requirements for efficient loading throughput and time saving.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 59% of the total text.

Power Switching With Arbitration for a Functional Tester

      A circuit interlock scheme which prevents operators of a
functional tester from lethal voltages accidentally caused by control
software or other errors.  The test system power supplies are also
protected from serious damage which could result from an illegal test
condition or sequence.  Standard practice is to only handle runs of a
single card type and only one card can be fully fixtured.  This
tester is capable of simultaneously fixturing two different types of
analog cards, each with different power requirements for efficient
loading throughput and time saving.

      This electronic card tester has two separate test heads for
testing two cards of different type and power supplies via dual
fixtures all sharing a common set of instrumentation.  The fixtures
are activated using a vacuum. When a vacuum is applied, the card
under test is brought into contact with spring-loaded probes which
provide the electrical connections to the card.  For test efficiency,
both fixtures may have vacuum applied simultaneously and the
situation arises where both cards may have the external tester power
supplies present.  The cards being tested when connected to these
power supplies produce CRT final anode voltages of 25,000 V capable
of killing the system operator.

      To prevent such an occurence, or damage to the tester power
supplies, a series of interlocks has been incorporated in the tester
which implemen...