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Browse Prior Art Database

BUG Device for Diagnostic And Reliability Testing

IP.com Disclosure Number: IPCOM000120843D
Original Publication Date: 1991-Jun-01
Included in the Prior Art Database: 2005-Apr-02
Document File: 1 page(s) / 24K

Publishing Venue

IBM

Related People

Vo, LX: AUTHOR

Abstract

Disclosed is an electronic test device, called BUG RUNNER. BUG RUNNER generates signal errors which are applied to a unit under test during a serviceability or RAS evaluation.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 100% of the total text.

BUG Device for Diagnostic And Reliability Testing

      Disclosed is an electronic test device, called BUG
RUNNER. BUG RUNNER generates signal errors which are applied to a
unit under test during a serviceability or RAS evaluation.

      BUG RUNNER is designed as a bug device to provide bugs or
signal errors that simulate the following conditions for testing
purposes:
           Permanent failure
           Re-occurring intermittent problems
           "One time" intermittent problem

      Test signal errors ranging in time from nanoseconds to seconds
and at levels of  12 volts are generated.  These error signals are
injected at various test points on the logic to simulate failures up
to 12 volts for both analog and digital signals.  Devices under
test are defined as follows:
           Module (components) level
           Card level
           System Unit level
           System level (over all).