Browse Prior Art Database

Decal Contactor with Decoder

IP.com Disclosure Number: IPCOM000120931D
Original Publication Date: 1991-Jun-01
Included in the Prior Art Database: 2005-Apr-02
Document File: 1 page(s) / 41K

Publishing Venue

IBM

Related People

Mills, GT: AUTHOR [+3]

Abstract

By means of a flexible contactor circuit having an integral decoder to identify and allow isolation of bad chips, burn-in testing and subsequent full testing of good chips is performed prior to dicing. The flexible contactor may also be used to test diced chips mounted in a testing fixture. Problems with bad chips shorting common buses is avoided by using the decoder.

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This is the abbreviated version, containing approximately 100% of the total text.

Decal Contactor with Decoder

      By means of a flexible contactor circuit having an integral
decoder to identify and allow isolation of bad chips, burn-in testing
and subsequent full testing of good chips is performed prior to
dicing.  The flexible contactor may also be used to test diced chips
mounted in a testing fixture. Problems with bad chips shorting common
buses is avoided by using the decoder.

      Referring to the figure, decal wiring 2 is pressed by elastomer
backing 4 to make connection between dendrite or bump contacts 6 and
lead/tin (Pb/Sn) chip contacts 8 on wafer 10.  Wafer 10 is installed
in holder 12.  Clamping devices 14 hold decal wiring 2 in place and
apply pressure to elastomer backing 4 via cover plate 16.  Decoder
chip 18 wired to circuits on decal 2 provides means to detect bad
chips which short common buses and to enable an operator to open
circuits to those bad chips.  Connector 20 is used to connect to a
burn-in or final tester.

      A holder having cavities or pockets for chips instead of a
cavity for a single undiced wafer may replace holder 12 to perform
burn-in and final test on diced chips.

      Disclosed anonymously.