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Manual Test Probing of Very Small Targets on the Top and Bottom of a Module Simultaneously

IP.com Disclosure Number: IPCOM000121806D
Original Publication Date: 1991-Sep-01
Included in the Prior Art Database: 2005-Apr-03
Document File: 1 page(s) / 34K

Publishing Venue

IBM

Related People

Eastman, J: AUTHOR [+2]

Abstract

Disclosed is a fixture to be used with standard probe station tools that will provide a precise location and pressure bottom side probe.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 100% of the total text.

Manual Test Probing of Very Small Targets on the Top and Bottom of
a Module Simultaneously

      Disclosed is a fixture to be used with standard probe station
tools that will provide a precise location and pressure bottom side
probe.

      The fixture is made up of the nonconductive base 1 with a
conductive rubber interface 2 that provides the electrical path.  An
epoxy glass interposer 3 is drilled to the bottom side pad locations
or standard grid.  The epoxy glass interposer drill hole size is to
accommodate the the spring pin electrical contact 4.  A frame is
provided to locate the the module under test.

      The fixture is used with standard module probe tools as
follows:  the operator selects the bottom side pin to be probed and
inserts a spring pin contact in the corresponding hole in the
interposer.  The model is placed in the frame as normal operation.
The operator probes the top side with the existing tool.

      The spring contact provides the electrical contact from the
bottom side of the module through the conductive rubber to the
measurement system

      Disclosed anonymously.