Browse Prior Art Database

Laser Measurement System

IP.com Disclosure Number: IPCOM000122087D
Original Publication Date: 1991-Oct-01
Included in the Prior Art Database: 2005-Apr-04
Document File: 1 page(s) / 37K

Publishing Venue

IBM

Related People

Good, DL: AUTHOR [+4]

Abstract

Disclosed is a device which incorporates a non-contact optical measurement technique to determine the radial run-out (eccentricity) of disk stack components and determines the assembly imbalance from the resultant cumulative eccentricity.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 100% of the total text.

Laser Measurement System

      Disclosed is a device which incorporates a non-contact optical
measurement technique to determine the radial run-out (eccentricity)
of disk stack components and determines the assembly imbalance from
the resultant cumulative eccentricity.

      The figure shows an outline of the system associated with
measuring a single component.  Using a laser diode 2 and an
integrated circuit laser driver 1, a beam of infrared light 3 is
passed through a pair of focusing lenses 4.  The lenses focus the
infrared beam into a plane 5 that intersects the component edge 6 at
a right angle.  The portion of the flat beam that is not blocked by
the rotating component is transmitted to an infrared photo-detector 7
where an electronic signal is generated.  The resulting voltage
signal is amplified 8, converted from analog to digital 9, and passed
to the controlling computer 10.  As the components are rotated, the
information from the processed signals is retained to calculate the
run-out, perform comparisons, estimate disk stack imbalance, and run
diagnostic plots.

      Disclosed anonymously.