Browse Prior Art Database

Thermal Electric Cooler Assisted Freon System for Integrated Circuit Chips

IP.com Disclosure Number: IPCOM000122418D
Original Publication Date: 1991-Dec-01
Included in the Prior Art Database: 2005-Apr-04
Document File: 3 page(s) / 79K

Publishing Venue

IBM

Related People

Mosley, J: AUTHOR [+2]

Abstract

Described is a thermal electric cooler (TEC)-assisted FREON* system that is designed to enable slower/faster sorted circuit chips to be adjusted so as to operate at the same speed, thus increasing the multi-chip system performance.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 78% of the total text.

Thermal Electric Cooler Assisted Freon System for Integrated Circuit
Chips

      Described is a thermal electric cooler (TEC)-assisted
FREON* system that is designed to enable slower/faster sorted circuit
chips to be adjusted so as to operate at the same speed, thus
increasing the multi-chip system performance.

      In prior art, nitrogen cryogenic devices have been built to
increase the performance of integrated circuits. However, the devices
have been expensive and difficult to handle due to the danger of
liquid nitrogen spills.  It is assumed that the performance of
multi-chip systems is limited to the performance of the slowest chip
in the system due to chip delay variations and system clocking timing
considerations.

      Fig. 1 shows the relationship that a chip can operate in if
cooled. During manufacture, performance differences can be observed
due to tolerance variations of the processing.

      The concept described herein provides a means whereby the
cooling of the circuit chips is brought to the correct cooling
temperature so that all of the chips in the system will have the same
delay.  The temperature is controlled by having the TEC operate in a
feedback loop.

      Each chip contains a string of logic fed back onto itself so as
to provide oscillation.  This logic within each chip is designed so
as to simulate the design performance for the system.  The frequency
of oscillation is measured and compared to the correct performance
fo...