Browse Prior Art Database

Functional Diagnostic Enhanced Time Domain Algorithm

IP.com Disclosure Number: IPCOM000122592D
Original Publication Date: 1991-Dec-01
Included in the Prior Art Database: 2005-Apr-04
Document File: 2 page(s) / 53K

Publishing Venue

IBM

Related People

O'Dell, JT: AUTHOR [+2]

Abstract

This article describes an algorithm which simplifies functional test development.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 100% of the total text.

Functional Diagnostic Enhanced Time Domain Algorithm

      This article describes an algorithm which simplifies
functional test development.

      Traditional functional testing requires a long test development
cycle for each selected product.  Software for a functional test of
one product will be different for another product.  Another
difficulty encountered in traditional functional testing is the
inability to efficiently diagnose a defect to the source net.

      A simple but effective solution is to apply the functional
diagnostic enhanced time domain algorithm of Fig. 1 within the
functional self-test and diagnostic tester of Fig. 2 as well.

      The functional diagnostic enhanced time domain algorithm takes
signatures from a known good board (KGB) and the board under test
(BUT).  If an error is detected by the diagnostic program, the
algorithm will divide the code executed until the error is
sufficiently confined for data analysis.  This is accomplished by
dividing the code by identification of each significant hex character
in the register from the most significant to least significant
character.  This reduces the required registers to one and enables
the diagnostic program to easily isolate the defective net.  All of
this can be accomplished quickly regardless of the card under test.