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Apparatus for Moving Substrates with Multiple Circuits through a Testing Process

IP.com Disclosure Number: IPCOM000123226D
Original Publication Date: 1998-Jul-01
Included in the Prior Art Database: 2005-Apr-04
Document File: 2 page(s) / 91K

Publishing Venue

IBM

Related People

Barringer, WA: AUTHOR [+3]

Abstract

Disclosed is apparatus for moving a substrates into and through a testing process sequentially applied to independently testable circuits aligned along the substrate. The substrates are typically flexible and elongated in the direction in which the circuits are aligned.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 52% of the total text.

Apparatus for Moving Substrates with Multiple Circuits through a
Testing Process

   Disclosed is apparatus for moving a substrates into and
through a testing process sequentially applied to independently
testable circuits aligned along the substrate.  The substrates are
typically flexible and elongated in the direction in which the
circuits are aligned.

   FIG. 1, a plan view of the apparatus, is divided into
FIG. 1A showing a right portion thereof, and FIG. 1B showing a left
portion thereof.  FIG. 2 is a transverse cross-sectional view of the
apparatus, taken as indicated by section line II-II in FIG. 1A, with
a substrate being engaged by a carriage therein.

   The apparatus includes a loading section 10 in which a
substrate 12 is placed on a first conveyer belt 14 moving in the
direction of arrow 16, a transfer section 18 in which the substrate
12 is transferred from the conveyer belt 14 to a carriage 20, an
inspection section 22 in which the substrate 12 is moved, in
attachment with the carriage 20, in an incremental motion through a
testing station 23, and an unloading section 24, in which the
substrate 12 is transferred from the carriage 20 to be moved away in
the direction of arrow 16 along a second conveyer belt 26.

   Each substrate 12 includes, in this example, four circuits
28.  In general, these circuits 18 are identical, with the substrate
12 being cut into four pieces after the testing process to provide
individual circuits.  The substrate 12 also includes, near its
corners, four locating holes 30, and, along its edges, a number of
attachment holes 32.  These holes 30, 32 may be part of a pattern of
sprocket holes extending along the edges of the substrate 12.

   Operation of the apparatus is begun when the substrate 12
is placed on the first conveyer belt 14 between the tapered entrance
portions 34 of guiding structures 36.  The conveyer belt 14 then
drives the substrate 12 in the direction of arrow 16 against a
stopping surface 38.  A lifting bar 40 next raises, in the direction
of arrow 42, being driven upward by an actuator 44 at each end, so
that a locating pin 46 at each end of the lifting bar 40 engages a
corresponding locating hole 30 in the substrate 12.  The locating
pins 46 may be tapered, and may be driven through an eccentric motion
to ensure engagement within the holes 30.  The upward motion of
lifting bar 40 lifts the substrate 12 off conveyer belt 14 and above
stopping surface 38.

   Within the carriage 20, a mechanism for holding the
substrate 12 includes an upper gripping bar 48 and a lowe...