Browse Prior Art Database

An Array Tester for the TFT Array with Multiplexer on Glass

IP.com Disclosure Number: IPCOM000123984D
Original Publication Date: 1999-Sep-01
Included in the Prior Art Database: 2005-Apr-05
Document File: 3 page(s) / 90K

Publishing Venue

IBM

Related People

Mekata, Y: AUTHOR [+2]

Abstract

Disclosed is a low-cost TFT (Thin Film Transistor) Array Tester for the specific TFT Array substrate, which has the Multiplexers in both DATALINE and GATELINE at the edge of glass. A unit with which one sensor and one probe needle supports several datalines or several gatelines. Figure 1, 2. The ordinal method required full contact for each datalines and gatelines, thus it requires a number of probe needles and sensing circuits as same as the number of datalines and gatelines. It increases the cost of testing according to the panel evolution into high density one. Also it makes to keep stable needle contact difficult because of narrowness between pad and pad.

This text was extracted from an ASCII text file.
This is the abbreviated version, containing approximately 61% of the total text.

An Array Tester for the TFT Array with Multiplexer on Glass

   Disclosed is a low-cost TFT (Thin Film Transistor) Array
Tester for the specific TFT Array substrate, which has the
Multiplexers in both DATALINE and GATELINE at the edge of glass.  A
unit with which one sensor and one probe needle supports several
datalines or several gatelines.  Figure 1, 2.  The ordinal method
required full contact for each datalines and gatelines, thus it
requires a number of probe needles and sensing circuits as same as
the number of datalines and gatelines.  It increases the cost of
testing according to the panel evolution into high density one.  Also
it makes to keep stable needle contact difficult because of
narrowness between pad and pad.  On the country, this tester enables
testing TFT Array with relatively less probe needles compared to the
ordinal full contact way and using common probe unit for the
different size and density panels.  In addition, it extends the
probing tolerance.  As the result of these improvements, this new
Array Tester decrease set-up time, maintenance time, and total
testing costs.

   Followings are the parameters which are required to test
the this specific TFT Array panel.
  1.  Data Multiplexer address, which select Data Line.
      (DATA MUX)
  2.  Gate Multiplexer address, which select Gate Line.
      (GATE MUX)
  3.  On Voltage for Data Selector.             (VDSON)
  4.  Off Voltage for Data Selector.       ...