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S-Parameter De-Embedding Using Time Conversion Extraction

IP.com Disclosure Number: IPCOM000127429D
Publication Date: 2005-Aug-30
Document File: 2 page(s) / 49K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method that isolates the scattering parameters (i.e. s-parameters) associated with a unique sub-element or part of a system. Benefits include a solution that provides a more reliable and accurate measured data representation of an element within a system.

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S-Parameter De-Embedding Using Time Conversion Extraction

Disclosed is a method that isolates the scattering parameters (i.e. s-parameters) associated with a unique sub-element or part of a system. Benefits include a solution that provides a more reliable and accurate measured data representation of an element within a system.

Background

Electrical models that can be generated from a data extraction technique include packages, connectors, sockets, and traces on printed circuit boards. The electrical models are used by designers in their design simulations of new circuits. The simulations provide an accurate circuit response of the new design that does not include the effects of fixturing, test setups, or any other extrinsic elements of a system.

General Description

The disclosed method isolates the s-parameters associated with a unique sub-element or part of a system (see Figure 1). The disclosed method includes the following steps:

1.      Collecting or measuring the s-parameter data of a complete system in the frequency domain

2.      Converting the frequency domain data to the time domain

3.      Extracting the time domain information of the unique sub-element of the system

4.      Extracting the associated embedded or multiple reflection effects of the sub-element within the time domain

5.      Converting the extracted time domain representation of the sub-element and the associated multiple reflection effects of the sub-element from the time domain to the frequency domain

Advantages

The disclos...