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Avoid to use bad memory by segment control

IP.com Disclosure Number: IPCOM000127540D
Publication Date: 2005-Aug-31
Document File: 1 page(s) / 44K

Publishing Venue

The IP.com Prior Art Database

Abstract

Our current HDD has a system ECC function in order to detect and correct DRAM error. 1 symbol error per page (512 byte +ECC) can be corrected by system ECC function, but 2 or more errors per page causes hardware failure. If bad memory locations are registered and never used, the availability and reliability of the system ECC function is improved.

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Avoid to use bad memory by segment control

(1) Perform memory test in various condition at Manufacturing. If vulnerable position is detected, its location is recorded in EEPROM.

(2) Perform memory test at Power On Reset. If vulnerable position is detected, its location is recorded.
(3) Vulnerable memory locations detected in (1) and (2) are merged, then registered in SG table.

(4) While performing Read/Write operation, memory location registered in (3) is not used.

Disclosed by Hitachi Corporation

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