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Non-Destructive Technique to Quantify Cobalt Depletion in PCD

IP.com Disclosure Number: IPCOM000127570D
Publication Date: 2005-Sep-01
Document File: 1 page(s) / 24K

Publishing Venue

The IP.com Prior Art Database

Abstract

The purpose is to provide a non-destructive measurement technique to quantify the depth of the cobalt depleted region in polycrystalline diamond. Current methods used to quantify cobalt depleted regions requires the sample be sectioned, ground, and the depleted region measured in an SEM (Scanning Electron Microscope). This non-destructive method uses "thin film" measurement technology (X-Ray Fluorescence) to quantify the thickness of the depleted region by establishing a calibration curve, relating the XRF intensity of cobalt to the thickness measurements obtained from the SEM micrographs.

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Non-Destructive Technique to Quantify Cobalt Depletion in PCD

The purpose is to provide a non-destructive measurement technique to quantify the depth of the cobalt depleted region in polycrystalline diamond. Current methods used to quantify cobalt depleted regions requires the sample be sectioned, ground, and the depleted region measured in an SEM (Scanning Electron Microscope). This non-destructive method uses "thin film" measurement technology (X-Ray Fluorescence) to quantify the thickness of the depleted region by establishing a calibration curve, relating the XRF intensity of cobalt to the thickness measurements obtained from the SEM micrographs.