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Intelligent Charge Pump Monitor

IP.com Disclosure Number: IPCOM000129013D
Published in the IP.com Journal: Volume 5 Issue 10A (2005-10-25)
Included in the Prior Art Database: 2005-Oct-25
Document File: 1 page(s) / 55K

Publishing Venue

Siemens

Related People

Juergen Carstens: CONTACT

Abstract

In the Automotive market, In-System diagnosis has become more and more important. This refers to electronics, able to verify the functionality by self check (or self test). In particular, many SoCs (System-On-Chip) are using internal voltage generators (so called voltage charge pumps) to generate higher voltages for specific sub-circuits, like SRAM memories, Flash memories, etc. Up to date it was not possible to diagnose the performance of an embedded charge pump.

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Intelligent Charge Pump Monitor

Idea: Massimo Atti, IT-Padova; Francesco Bonacina, IT-Padova

In the Automotive market, In-System diagnosis has become more and more important. This refers to electronics, able to verify the functionality by self check (or self test). In particular, many SoCs (System-On-Chip) are using internal voltage generators (so called voltage charge pumps) to generate higher voltages for specific sub-circuits, like SRAM memories, Flash memories, etc. Up to date it was not possible to diagnose the performance of an embedded charge pump.

With the following circuit it is possible to perform charge pump screening and in-system diagnosis during life time of embedded flash charge pumps. Therefore, during in-system diagnosis, an appropriate load (R_Load) is connected at the output of the charge pump (Fig. 1). The load can be implemented directly with an appropriate transistor. This transistor is only enabled during in-system diagnosis, productive testing or production test operations (Fig. 2). Moreover, in production tests it is even possible to operate the device with the additional load giving a test margin to the user's operating point (zero defect program).

Fig. 1:

Fig. 2:

© SIEMENS AG 2005 file: ifx_2005J52861.doc page: 1

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