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A Method to Generate New Tests by Scheduling and Injecting Events Without Changing the Functional Test Code

IP.com Disclosure Number: IPCOM000130393D
Original Publication Date: 2005-Oct-21
Included in the Prior Art Database: 2005-Oct-21
Document File: 2 page(s) / 139K

Publishing Venue

IBM

Abstract

A method to generate new tests by scheduling and injecting events without changing the functional test code.

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A Method to Generate New Tests by Scheduling and Injecting Events Without Changing the Functional Test Code

Disclosed is a method to generate new tests by scheduling and injecting text file based events without requiring recompilation or modifying functional test code. Functional test code is developed to test and validate all the functions of Device under Test (DUT). A top shell (functional test environment) is added which has many different points connected into the Functional test code that allows monitoring as well as injecting events. New tests are generated without recompiling or modifying functional test code by the Block A in the figure below, which schedules and injects events from the event list. New tests are also created during run time by how the events are scheduled and injected including: sequential events, parallel events, event triggers, time delay triggers, interference events, , clock variations, registers configuration and no operations. Randomize events or revising events on the fly also produces new set of tests. Randomize the sequence of events, type of events and how the events are scheduled and injected also produces unique new tests. The key benefit is new tests are generated during run time without modifying functional test code and recompiling. The novelty of our idea is that any event (good or bad) can be injected into any test case (good path or bad path) during run time. These events don't necessarily have to be error injections; th...