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Method for an ESD-reactive PCB silkscreen

IP.com Disclosure Number: IPCOM000130482D
Publication Date: 2005-Oct-25
Document File: 2 page(s) / 107K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for an electrostatic discharge (ESD) reactive printed circuit board (PCB) silkscreen. Benefits include improved functionality, improved reliability, an improved test environment, and improved cost effectiveness.

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Method for an ESD-reactive PCB silkscreen

Disclosed is a method for an electrostatic discharge (ESD) reactive printed circuit board (PCB) silkscreen. Benefits include improved functionality, improved reliability, an improved test environment, and improved cost effectiveness.

Background

      ESD can occur during PCB assembly. Damage can occur that in many cases is not detectable using conventional testing procedures. Individual tools, such as resistance meters, surface resistance probes, and static meters, are used to monitor ESD/electrical overstress (EOS) during the manufacturing process. However, these tools do not measure aggregate stress and do not map the location of the stress on the PCB. No conventional tool assesses ESD/EOS damage during PCB assembly.

General description

              The disclosed method is a real-time reactive PCB silkscreen that is applied during fabrication of the PCB. The method can be used as an ESD monitor for conventional manufacturing assembly lines. The silkscreen changes color when exposed to electrical shock. The color change is scaled to the ESD shock load and indicates the aggregate load received at that location on the PCB. The method enables ESD problems to be identified and corrected before damaged product is manufactured.

Advantages

              The disclosed method provides advantages, including:
•             Improved functionality due to indicating the aggregate ESD/EOS load on the PCB

•             Improved functionality due to mapping the ESD/EOS load at specific locations on the PCB

•             Improved reliability due to detecting ESD/EOS damage

•           ...