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Method for a power cycle device

IP.com Disclosure Number: IPCOM000132318D
Publication Date: 2005-Dec-07
Document File: 4 page(s) / 116K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for a power cycle device. Benefits include improved functionality, improved reliability, an improved development environment, and an improved test environment.

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Method for a power cycle device

Disclosed is a method for a power cycle device. Benefits include improved functionality, improved reliability, an improved development environment, and an improved test environment.

Background

              For integrated circuit (IC) design, timing control and usage data are required for controlling the power cycle. These functions are conventionally performed by the hardware unit and its system-test software. However, the generated data can be faulty due to major timing issues that can result because the software is not being used for its original purpose. Additionally, conventional solutions are cumbersome to set up and utilize.

General description

              The disclosed method is a power cycle device (PCD) coupled to an engineering or consumer platform to test the power cycle of a microprocessor. The device can be used for validation during research, development, and quality/reliability testing.

              The key elements of the disclosed method include:

•             Single device capable of testing two units under test (UUTs)

•             Operator friendly

•             Switches to help the operator set and reset the processors and platforms that are under test

•             Indicators to help monitor the progress of the power cycle test

•             One power supply feeds two targets

•             Fast hook-up and unhook

•             Low power consumption components

•             Components that are readily available in the market to mass produce this unit

•             Extremely accurate data

Advantages

              The disclosed method provides advantages, including:
•             Improved functionality due to providing a power cycle device for validating a microprocessor power cycle

•             Improved reliability due to producing extremely accurate data

•             Improved development environment due to easily controlling, managing, and monitoring the power cycle of a unit under development

•             Improved test environment due to easily controlling, managing, and monitoring the power cycle of a UUT

Detailed description

              The PCD is comprised of several components, including the following:

•             Timing ICs

•             Logical gates

•             Transistors

•             Passive components

              When the system ON/OFF switch, S3, is pressed, the motherboard starts to boot. The processor fan is held OFF to assist the processor under test to reach its high temperature faster. When the temperature of the unit has reached the set le...