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Cost-Benefit Analysis for Optimizing Test Pattern Insertion

IP.com Disclosure Number: IPCOM000197731D
Publication Date: 2010-Jul-20
Document File: 2 page(s) / 34K

Publishing Venue

The IP.com Prior Art Database

Abstract

A method is provided to optimize insertion of test patterns executed on semiconductor chips. Test patterns are executed on a sample set of semiconductor chips and results of the executed test patterns are analyzed. The analysis identifies redundant and ineffective test patterns. The redundant and ineffective test patterns are then removed, thereby saving cost associated with test time, test equipment usage, etc.

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Cost-Benefit Analysis for Optimizing Test Pattern Insertion

Disclosed is a method of optimizing insertion of test patterns executed on semiconductor chips. Test patterns are executed on a sample set of semiconductor chips and results of the executed test patterns are analyzed. The method involves analyzing fail data corresponding to the life cycle of a product. This analysis establishes relationships between various combinations of applied test patterns, and shows which test patterns are redundant or ineffective. The redundant and ineffective test patterns are then removed thereby saving cost in terms of test time, test equipment usage, etc.

Thereafter, the method determines the most effective combinations of test patterns based on the accumulated escape data. This is accomplished by determining the order in which the test patterns are to be removed based on the escape data. The test pattern that causes the least number of test escapes (false passes) is removed first, followed by the test pattern that causes the second least number of test escapes and so on. Thereafter, based on knowing the number of test escapes associated with removing each test pattern, coupled with the cost of test escapes and the cost of test time, a tradeoff is established to show the optimal number of test patterns to remove, and the expected rate of test escapes. The Figure exemplarily illustrates a tradeoff between removed test patterns and the resulting test time savings vs. the cost of...