Dismiss
InnovationQ will be updated on Sunday, Oct. 22, from 10am ET - noon. You may experience brief service interruptions during that time.
Browse Prior Art Database

CRYSATLLINE FORM OF (3AR, 4S, 7R, 7AS)-2-[(1R, 2R)-2-[4-(1, 2-BENZISOTHIAZOL-3-YL)-PIPERAZIN-1-YLMETHYL]-CYCLOHEXYLMETHYL] HEXAHYDRO-4, 7- METHANO-2HISOINDOLE-1, 3- DIONE

IP.com Disclosure Number: IPCOM000205355D
Publication Date: 2011-Mar-28
Document File: 3 page(s) / 75K

Publishing Venue

The IP.com Prior Art Database

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 54% of the total text.

Page 01 of 3

CRYSATLLINE FORM OF (3AR, 4S, 7R, 7AS)-2-[(1R, 2R)-2-[4-(1, 2-

BENZISOTHIAZOL-3-YL)-PIPERAZIN-1-YLMETHYL]-

CYCLOHEXYLMETHYL] HEXAHYDRO-4, 7- METHANO-2HISOINDOLE-

1, 3- DIONE.

(3aR,4S,7R,7aS)-2-{(1R,2R)-2-[4-(1,2-benzisothiazol-3-yl)piperazin-1- ylmethyl]cyclohexylmethyl}hexahydro-4,7-methano-2Hisoindole-1,3-dione hydrochloride referred as 'LRS', of the following formula:

(This page contains 00 pictures or other non-text object)

,

is a potent antagonist of dopamine D2, serotonin 2A, and serotonin 7 receptors with a high affinity for serotonin 1A receptor.

Described hereinafter, is a crystalline form of LRS free base.

    Crystalline LRS free base is characterized by data selected from: an X-ray powder diffraction pattern having peaks at 11.3, 15.2, 15.7, 16.4 and 16.7± degrees 2- theta ± 0.2 degrees 2-theta; an X-ray powder diffraction pattern substantially as depicted in Figure 1; and combinations thereof.

Figure 1: an X-ray powder diffraction pattern of crystalline LRS free base. Peak at
28.48 °2θ belongs to silicon.

1


Page 02 of 3

Intensity (counts)

10000

6400

3600

1600

400

0

5 10 15 20 25 30 35

Crystalline LRS free base is further characterized by data selected from a group consisting of: X-ray powder diffraction pattern, having peaks at about 14.1, 18.1,
19.2, 20.1 and 22.4 ± 0.2 degrees two-theta.

X-ray powder diffraction:

After being powdered using mortar and pestle, sample was applied directly on a silicon plate holder. The X-ray powder diffraction pattern was measured with a Philips X'Pert PRO X-ray powder diffractometer, equipped with a Cu irradiation source = 1.54184 Ǻ (Ǻngström), X'Celerator (2.022º 2θ) detector. Scanning parameters: angle range: 3-40 deg., step size 0.0167, time per step 37 s, continuous scan. The described peak positions...