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Method and System for Accessing Adjacent Pins using Programmable High Frequency Probing Systems

IP.com Disclosure Number: IPCOM000206393D
Publication Date: 2011-Apr-21
Document File: 1 page(s) / 60K

Publishing Venue

The IP.com Prior Art Database

Abstract

A method and system for accessing adjacent pins of a Device Under Test (DUT) using programmable high frequency probing systems is disclosed.

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Method and System for Accessing Adjacent Pins using Programmable High Frequency Probing Systems

Disclosed is a method and system for accessing adjacent pins of a Device Under Test (DUT) using programmable high frequency probing systems. The method of accessing adjacent pins of the DUT is illustrated using Fig. 1.

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Figure 1

The method involves milling a hole in a pin package in order to cover multiple pin locations. In an embodiment, the hole milled in the pin package is square in shape. The hole may be milled in a location of a probe template over which an access to adjacent pins is required. The hole is milled in an alternating pattern such that alternate pin locations are accessible. Further, a plug is milled to match the pins. The plug may be pre-drilled to receive a signal probe. In order to access the adjacent pins, the plug is removed from its current position over the pins, rotated by 90 degrees, and then reinserted over the adjacent pins. In a scenario, the adjacent pins may be simultaneously accessed by creating plugs with unique patterns.

Thus, the method and system disclosed herein enables access to adjacent pins even after pin placement is established over a pin package. Further, the method provides flexibility to designers for testing pins due to less constraint over placement of pins.

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