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Automatic Switch Between Light Sets for Mark Inspection

IP.com Disclosure Number: IPCOM000234833D
Publication Date: 2014-Feb-10
Document File: 2 page(s) / 157K

Publishing Venue

The IP.com Prior Art Database

Abstract

We propose automatically switching between two or more light sets during inspection of Flip Chip and other packages to help accommodate the variation of surface roughness during automated mark inspection.

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Document Title 

Automatic Switch Between Light Sets for Mark Inspection

Abstract 

We propose automatically switching between two or more light sets during inspection of Flip Chip and other packages to help accommodate the variation of surface roughness during automated mark inspection.

Body 

Currently, the automated marking vision inspection system for Flip Chip products is not efficient due to the variation of the surface roughness of the die and lid of the units.  This causes the marking to be inconsistent as seen by the marking vision inspection system.  The current vision inspection system depends on one light set for marking inspection (Fig 1).  We propose a feature that enables the vision inspection system to automatically switch from one light set to “n” light sets until to accommodate different mark contrasts (Fig 2).  The feature may be implemented in software that enables the vision system to automatically switch to a different light set whenever the inspection fails.  This would eliminate the dependency of manual inspection by an operator and allow for fully automated mark inspection.  This will also reduce handling of parts after scan, which will improve product cycle time.

Drawings

Figure 1 shows a current Vision System with one light set; and

Figure 2 shows the proposed Vision System with 2 to “n” Light Sets.

                               FIGURE 1

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