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Method for Accurate Circuit Analysis/Projections using TCAD-based SPICE Parameters

IP.com Disclosure Number: IPCOM000235474D
Publication Date: 2014-Mar-03
Document File: 2 page(s) / 56K

Publishing Venue

The IP.com Prior Art Database

Abstract

A method is disclosed for effective use of Technology Computer-Aided Design (TCAD) data for improving Very-Large-Scale Integration (VLSI) circuit performance and yield. The method extracts Simulation Program with Integrated Circuit Emphasis (SPICE) parameters using available model parameters.

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Method for Accurate Circuit Analysis /

Parameters

Disclosed is a method for effectively using Technology Computer -Aided Design (TCAD) data for improving Very-Large-Scale Integration (VLSI) circuit performance and yield. The method discloses a physical concept for understanding important regions of circuit operations for improving VLSI circuit performance and yield . The method accurately extracts Simulation Program with Integrated Circuit Emphasis (SPICE) parameters using available model parameters such as models in previous process or generation . In addition, the method enables understanding of physically-related circuit-based model parameters.

Fig. 1 discloses the steps involved for accurately and efficiently extracting TCAD -based model parameters.

Fig. 1

As illustrated in Fig. 1, the method updates the process initially for TCAD -based model parameter extraction (sub22nm models or any other). Thereafter, the method simulates DC data using TCAD for wide range operating Vcc. Moving on, the method applies a physics concept to extract key model parameters (e.g. L=23nm L=20nm). Subsequently, the method evaluates physically related parameters such as , but not limited to, vsat, DIBL, Rs/d, and Vth0.

Thereafter, the method provides quick and accurate TCAD-based model overrides for the updated process and device. The method also makes direct use of a 3D TCAD structure for accuracy. The target based overrides are focused on one or more of , but not limited to, Idli...