Browse Prior Art Database

Use of Virtual Factory Objects as a Factory Setup Diagnostic Tool

IP.com Disclosure Number: IPCOM000236418D
Publication Date: 2014-Apr-24
Document File: 2 page(s) / 64K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is virtual method for testing factory systems setup and identifying errors. This approach eliminates the need to use physical components, thereby accelerating the process and reducing the risk to actual production material.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 57% of the total text.

Page 01 of 2

Title

Use of Virtual Factory Objects as a Factory Setup Diagnostic Tool

Abstract

Disclosed is virtual method for testing factory systems setup and identifying errors. This approach eliminates the need to use physical components, thereby accelerating the process and reducing the risk to actual production material.

Problem

Currently, hundreds of people are involved with factory systems setup that involves manual data entry. This ultimately results in numerous errors in the setup, requiring validation of the setup using a sacrificial or "pipe cleaner" lot. In this scenario, incorrect factory systems setup is detected when a factory systems error occurs, resulting in the pipe cleaner lot being placed on hold. At this point, the error must be diagnosed. This process results in lost time and lost productivity. This process can take weeks to months before identifying all setup errors and can be complicated by changes to the factory system setup after pipe cleaning.

A method is needed to facilitate the rapid identification of set up errors in production factory automation systems without the use of, or risk to, production material.

Solution/Novel Contribution

The novel idea expands upon the concept of the physical "pipe cleaner", but removes the actual physical components of the process. The new approach replaces the physical lot with a set of virtual objects in the factory systems that provide the same functionality.

Method/Process

By generating a virtual wafer carrier...