Browse Prior Art Database

In Circuit Test Probe pin for back drilled vias

IP.com Disclosure Number: IPCOM000236483D
Publication Date: 2014-Apr-29
Document File: 1 page(s) / 56K

Publishing Venue

The IP.com Prior Art Database

Abstract

An In Circuit Test (ICT) probe pin type that provides electrical contact to the via walls thus allowing the probing backdrilled vias on Printed Circuit Board (PCB's) is disclosed.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 60% of the total text.

Page 01 of 1

In Circuit Test Probe pin for back drilled vias

Disclosed is a In Circuit Test (ICT) probe pin type that provides electrical contact to the via walls thus allowing the probing back drilled vias on Printed Circuit Board (PCB's).

The goal is to provide a method to preserve test probe access to printed circuit boards (PCB) that have been back drilled.

The practice of 'back-drilling' PCB vias is becoming more common. Back-drilling is a process by which the Surface annular ring and some percentage of the via barrel are removed to reduce antennae effects caused by these structures and improve overall signal integrity. Once the via is back drilled conventional probing methods can not be used as the target area of probe contact, the via annular ring on the PCB surface has been removed. To get around this, the disclosed method probing inside the via hole. The solution is to design a probe that is inserted directly into the via and contact is made with the remaining copper plated on via walls. This technique would not require changing the PCB design only the probes place in the ICT fixture.

The proposed ICT probe would have single (or multiple) bifurcated pin tip intended to travel directly into the via. The tip would be designed so that when inserted into the via the pin presses against the via walls. This is similar to a "compliant pin" (see Figure 1) used in connector technologies but instead of the being designed to permanently set and anchor in the via, the proposed...