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Browse Prior Art Database

Composite Attribute Partial Good Method

IP.com Disclosure Number: IPCOM000241042D
Publication Date: 2015-Mar-21
Document File: 2 page(s) / 164K

Publishing Venue

The IP.com Prior Art Database

Abstract

A method and software is disclosed to identify and reassess the effectiveness of the partial good strategy throughout the design process so that designer may take action should the effectiveness degrade significantly.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 97% of the total text.

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Composite Attribute Partial Good Method

Semiconductor Products sometimes use logic partial good schemes. The design includes multiple logic blocks. Some blocks are allowed to fail at test. Failing blocks are not used at system level. Use of partial good methodology improves yield. Partial good schemes can change during the design process. Reducing content in partial good block decreases yield. Reducing the number of partial good blocks allowed to fail decreases yield. A partial good "scheme" is set at quote.

A method and software is disclosed to identify and reassess the effectiveness of the partial good strategy throughout the design process so that designer may take action should the effectiveness degrade significantly.

Figure 1: Current Process -- Design/Quote Interlock Data Flow

The novel contribution is a method to identify redundant logic blocks (RLB) at time of quote. The steps follow:


1. Create content (equivalent circuits) for each type (e.g., RLB1, RLB2)

A. Number of each type


B. Test Redundancy Factor (TRF)

• Example 2 of 4 must pass TRF = ½

C. Calculate redundant block logic equiv circuits for each RLB type
RLB1 x n = RLB1circuits

2. Put redundant logic block information into database 3. Create product netlist • Name = Name in quote reference database 4. At each design checkpoint
A. Calculate RLB equivalent circuits using above method

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B. Product equivalent circuits = RLB circuits + non RLB circuit content

Figure 2: Core idea

Fig...