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Test-Fixture for Unification of USB2.0 Characterization

IP.com Disclosure Number: IPCOM000241331D
Publication Date: 2015-Apr-17
Document File: 5 page(s) / 1M

Publishing Venue

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Abstract

The HI-speed USB 2.0 serial bus is used today in a broad range of computer as well as embedded designs. USB-IF physical layer compliance certification is required for all vendors using USB2.0 interface. USB-IF has specified many fixtures for carrying out different test setups. Making different hardware setups is a complicated process that leads to manual defects in measurement as may hamper the connector. In order to overcome these demerits a test fixture has been designed that is capable of performing all the USB2.0 electrical tests.

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Test-Fixture for Unification of USB2.0 Characterization

Abstract - The HI-speed USB 2.0 serial bus is used today in a broad range of computer as well as embedded designs. USB-IF physical layer compliance certification is required for all vendors using USB2.0 interface.  USB-IF has specified many fixtures for carrying out different test setups. Making different hardware setups is a complicated process that leads to manual defects in measurement as may hamper the connector. In order to overcome these demerits a test fixture has been designed that is capable of performing all the USB2.0 electrical tests.

                                                                                                                                                                I.          BAckground

Different types of test fixtures are required to perform USB2.0 CZ. These fixtures are recommended by USB-IF. Every test scenario requires different test setup with help of these test fixtures. With these fixtures, creating different types of hardware setups consumes a lot of time. The probability of manual error is also very high when creating so many setups, which also leads to complexity. With available fixtures, automation is near to impossible as these fixtures have manual switches. Also changing converters for different fixtures to connect with DUT sometimes damages the USB connector and also degrades the result. Different test fixtures for different scenarios makes the job complex for engineers and manual intervention while creating setups often causes failure in measurement, which leads to debug in wrong direction. Management of a large number of test fixture is also a cumbersome job.

                                                                                                                                                            II.         TEST FIXTURE

We have developed a test fixture that is capable of handling all the test scenarios specified by USB-IF. With the help of this test fixture, setup for all the test scenarios can be made at a single time and setup doesn’t need to be changed again and again for different test scenarios. In this way the test fixture solves all the issues related to manual errors in having to make different setups. It also leads to reduced complexity of making different setups. With this test fixture, automation of USB2.0 is also possible as it can be controlled through I2C. I2C expander is on board to control test fixtur...