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Dynamic Temperature Leakage Screen Method

IP.com Disclosure Number: IPCOM000241936D
Publication Date: 2015-Jun-09
Document File: 3 page(s) / 51K

Publishing Venue

The IP.com Prior Art Database

Abstract

A method and software to adjust semiconductor product leakage disposition limits using temperature at test is disclosed. This method eliminates the need to stabilize test temperature at predetermined limits; therefore, speeding the test process and reducing test costs.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 76% of the total text.

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Dynamic Temperature Leakage Screen Method

Semiconductor products require screening for leakage to meet power requirements in systems using these components. As shown in the figure below, leakage in semiconductor products increases exponentially as a function of temperature. This exponential dependency requires that temperature be tightly controlled at both wafer and module test to eliminate false rejects and escapes to system level. Tight control at test requires expensive equipment and expensive test time to ensure that test temperature is stabilized.

Figure 1: Leakage Variation as a Function of Temperature

A method and software to adjust semiconductor product leakage disposition limits

using temperature at test is disclosed. This method eliminates the need to stabilize test

1


Page 02 of 3

temperature at predetermined limits; therefore, speeding the test process and reducing

test costs. Figure 2 shows the current process and the new process.

Figure 2: Current and New Process (lighter-colored blocks show novel steps)

The novel contribution is a method to change semiconductor product leakage disposition specifications in response to temperature at the tester avoiding the need to stabilize temperature at a predetermined value. This new method eliminates tester temperature stabilization time which reduces test cost. The steps follow:

1. Define leakage as function of temperature using:
A. Table or
B. Equation

  2. Embed table or equation in test program 3. Measure Tempe...