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Flathead Anti-Rotated probe to resolve lead PKG burr issue

IP.com Disclosure Number: IPCOM000243120D
Publication Date: 2015-Sep-16
Document File: 3 page(s) / 138K

Publishing Venue

The IP.com Prior Art Database

Abstract

This paper demonstrates the development of Flathead Anti-Rotated probe (pogo pin). This probe is designed with a flathead on top of probe and an anti-rotated elliptical-boss in probe barrel. Flathead has much more contact area compare to crown and conical, which has good performance on final test yield because contact resistance is low; and anti-rotated elliptical-boss can prevent probe rotation, keep probe cross touch with material lead all the time, through which to eliminate burr VM issue generation.

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Flathead Anti-Rotated probeto resolve lead PKG burr issue

Abstract

This paper demonstrates the development of Flathead Anti-Rotated probe (pogo pin). This probe is designed with a flathead on top of probe and an anti-rotated elliptical-boss in probe barrel. Flathead has much more contact area compare to crown and conical, which has good performance on final test yield because contact resistance is low; and anti-rotated elliptical-boss can prevent probe rotation, keep probe cross touch with material lead all the time, through which to eliminate burr VM issue generation.

Key word

Test probe, Probe tip, Anti- rotation, Flathead, Contactor

Background

View the current probe (pogo pin) design, the type of top probe tip is crown or conical. Conical pin have bad performance on contact resistance since only 1 contact point; Crown have better performance on contact resistance due to 4 contact points, but both of them have many burr issue generated when probe located on the edge of material lead (Example shown asFigure 1). Our customers are expecting zero defect product, as a result, we have to take100% visual inspection under microscope to pick up & scrap burr defects.  

Figure 1. If probe located on the edge of material lead, burr issue will be generated

Disadvantage:

1. VM yield loss on burr issue.

2. Human resource wasted on manual VM inspection.

3. Potential CQI still existed as manual inspection.

Innovative Solution

Develop a new probe (pogo pin) with flathead on top of probe (pogo pin) and new socket m...