Dismiss
InnovationQ will be updated on Sunday, Oct. 22, from 10am ET - noon. You may experience brief service interruptions during that time.
Browse Prior Art Database

Highly-Repeatable Fixture for Consistent Low Resistance Measurements on Busbar Samples

IP.com Disclosure Number: IPCOM000245015D
Publication Date: 2016-Feb-05
Document File: 2 page(s) / 170K

Publishing Venue

The IP.com Prior Art Database

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 51% of the total text.

Page 01 of 2

Highly-Repeatable Fixture for Consistent Low Resistance Measurements on Busbar Samples

Disclosed by Anonymous

A fixture design, Figure 1, has been invented to enable a highly repeatable placement of sense and source probes onto a sample in order to measure the material electrical resistance. The sample materials may consist of high conductivity electrical busbars or welded busbars to terminals. A pocket design in the base enables consistent placement of electrical high conductivity samples to a location datum and may accommodate any geometric detail to enable a perpendicular surface to the vertical placement of probes onto the measurement surface. The probe assembly is translated down in a repeatable manner with the assistance of vertical rails that are placed on either side of the assembly and hard fixed to the base. Various ergonomic handles with robust leveraging mechanisms (only an example is shown in Figure 1) may be employed to advance the probe assembly towards the sample and hold it
in test position for measurement before releasing it back to opening position. The number of probes can range from 4 and above including a pair of source probes and a minimum single pair of sense probes. Shielded twisted pair cabling or better EMC protection may be used to connect the probes to the switchbox attached to the 4 terminal-based ohmmeter jacks on the instrumentation. Each probe has a spring loaded tip and is constructed of high conductivity (gold or equivalent coated) materials with a spike or round based end point as needed to make consistent electrical contact with sample. The combination of spring loaded probes hard fixed to the probe assembly, and adjusted appropriately in z- height, along with a fixed height spacer on the vertical support arms between the base and probe assembly enables the same...